Measure XRD pattern on Difrey 401 device in a 20-140° range using Cr Kα souce and 300 s exposition

Measure FTIR spectrum on Vertex 70v spectrometer using ATR mode, 4 cm-1 resolution and 32 scans/spectrum.
| Peak position, cm-1 | Peak association | DOI |
| 193 | MoO2 | 10.1088/0957-4484/18/11/115717 |
| 283 | ||
| 380 | in-plane E2g of MoS2 | 10.1016/j.cej.2020.124704 |
| 406 | out-of-plane A1g of MoS2 | 10.1016/j.cej.2020.124704 |
| 446 | MoO2 | 10.1088/0957-4484/18/11/115717 |
| 591 | MoO2 | 10.1088/0957-4484/18/11/115717 |
| 744 | MoO2 | 10.1088/0957-4484/18/11/115717 |
Take SEM photos on Jeol JSM F7600 at 15 kV and 10 mA